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本帖最后由 lcytms 于 2017-9-9 23:25 编辑
发展的必然趋势和主流,SoC设计方法要求IP 核标准化、规范化,给未来的发展带来便利。
由于IP复用的应用在不断的增加,SoC内部的测试结构甚至专用测试IP的复用,也一定会不断增加,以至于形成电子设计行业的测试复用设计标准,使SoC的测试设计强度降低,设计效率提高。
参考文献
[1] [2] [3] [4] [5] [6]
张兴,黄如,刘晓彦.《微电子学概论》[M],北京:北京大学出版社,2005
牛风举.《基于IP复用的数字IC设计技术》[M],北京:电子工业出版社,2003.9 郭兵,沈艳,林永宏等.《SoC 技术原理与应用》[M],北京:清华大学出版社,2006 李思昆,曾献君,郭阳.《VLSI设计方法学》[Z],国防科技大学计算机学院,2002.4
刘劲松,林涛.《整合多IP的SoC芯片的验证挑战和思路》[Z],杰尔系统上海有限公司,2006.2 (美)拉申卡,帕特森,信赫.《系统芯片(SoC)验证方法与技术》[M] ,北京:电子工业出版社,2005.1
IP Reuse and verification in SoC Design
Wu Xiaoxing
School of Microelectronics,Shanghai Jiaotong University,Shanghai (200240)
Abstract
In IC design, the reuse of IP core can shorten the product develop circuit and cost effectively, understand the present situation of application of IP core as well as the several current main organizations in IP industry and the correlation working conditions and the current international IP industry situation will be helpful to Chinese IP industry development. Carries on IP-reuse in SoC may obtain a higher productive force, but usually need to pass through many times experiment and error corrections to gain successful integrate IP into SoC. Keywords: SoC,IP-reuse,IP core
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